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Detection of multiple flaws in piezoelectric structures using XFEM and level sets

  • Detection of multiple flaws in piezoelectric structures using XFEM and level sets

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Metadaten
Document Type:Article
Author: S.S. Nanthakumar, Tom LahmerORCiDGND, Timon RabczukORCiDGND
Parent Title (English):International Journal for Numerical Methods in Engineering
Language:English
Date of Publication (online):2017/08/29
Year of first Publication:2016
Release Date:2017/08/29
Publishing Institution:Bauhaus-Universität Weimar
Institutes and partner institutions:Fakultät Bauingenieurwesen / Institut für Strukturmechanik (ISM)
Fakultät Bauingenieurwesen / Professur Stochastik und Optimierung
First Page:960
GND Keyword:Angewandte Mathematik; Stochastik; Strukturmechanik
Dewey Decimal Classification:600 Technik, Medizin, angewandte Wissenschaften / 620 Ingenieurwissenschaften
500 Naturwissenschaften und Mathematik / 510 Mathematik / 519 Wahrscheinlichkeiten, angewandte Mathematik
BKL-Classification:31 Mathematik / 31.80 Angewandte Mathematik
50 Technik allgemein / 50.31 Technische Mechanik
Licence (German):License Logo Copyright All Rights Reserved - only metadata