@inproceedings{VoellmeckeSchwendnerHoetal.,
  author    = {V{\"o}llmecke, Lars and Schwendner, Sascha and Ho, Ai Phien and Fischer, Jens and Seim, Werner},
  title     = {Assessment of nailed connections in existing structures},
  doi       = {10.25643/bauhaus-universitaet.6361},
  url       = {http://nbn-resolving.de/urn:nbn:de:gbv:wim2-20230609-63615},
  pages     = {7},
  abstract  = {This paper presents the development of an assessment scheme for a visual qualitative evaluation of nailed connections in existing structures, such as board trusses. In terms of further use and preservation, a quick visual inspection will help to evaluate the quality of a structure regarding its load-bearing capacity and deformation behaviour. Tests of old and new nailed joints in combination with a rating scheme point out the correlation between the load-bearing capacity and condition of a joint. Old joints of comparatively good condition tend to exhibit better results than those of poor condition. Moreover, aged joints are generally more load-bearing than newly assembled ones.},
  subject      = {Holzbau},
  language  = {en}
}
@inproceedings{KleinerRoessler,
  author    = {Kleiner, Florian and R{\"o}ßler, Christiane},
  title     = {Utilizing Modern FIB/SEM Technology and EDS for 3D Imaging of Hydrated Alite and its Pore Space},
  series = {ERICA-CASH II Final Converence},
  booktitle = {ERICA-CASH II Final Converence},
  doi       = {10.25643/bauhaus-universitaet.4455},
  url       = {http://nbn-resolving.de/urn:nbn:de:gbv:wim2-20210702-44555},
  pages     = {2},
  abstract  = {The exploration of cementitious materials using scanning electron microscopes (SEM) is mainly done using fractured or polished surfaces. This leads to high-resolution 2D-images that can be combined using EDX and EBSD to unveil details of the microstructure and composition of materials. Nevertheless, this does not provide a quantitative insight into the three-dimensional fine structure of for example C-S-H phases. The focused ion beam (FIB) technology can cut a block of material in thin layers of less than 10 nm. This gives us a volume of 1000 μm³ with a voxel resolution of down to 4 x 4 x 10 nm³. The results can be combined with simultaneously acquired EDX data to improve image segmentation. Results of the investigation demonstrate that it is possible to obtain close-to-native 3D-visualisation of the spatial distribution of unreacted C3S, C-S-H and CH. Additionally, an optimized preparation method allows us to quantify the fine structure of C-S-H phases (length, aspect ratio, …) and the pore space.},
  subject      = {Rasterelektronenmikroskop},
  language  = {en}
}